Invention Grant
- Patent Title: Measuring apparatus and area quality measuring method
- Patent Title (中): 测量仪器和面积质量测量方法
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Application No.: US11697460Application Date: 2007-04-06
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Publication No.: US08055202B2Publication Date: 2011-11-08
- Inventor: Rie Nagato , Yoshihiro Ishikawa
- Applicant: Rie Nagato , Yoshihiro Ishikawa
- Applicant Address: JP Tokyo
- Assignee: NTT DoCoMo, Inc.
- Current Assignee: NTT DoCoMo, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JPP2006-106875 20060407
- Main IPC: H04B17/00
- IPC: H04B17/00

Abstract:
A measuring apparatus for measuring service quality in an area in a communication system, in which a plurality of base stations use one frequency band for transmitting downlink signals, includes: a receiver configured to receive constant power signals that are the downlink signals transmitted by the base stations through constant power channels in which transmission powers are constant; a reception power measuring unit configured to measure reception powers of the constant power signals transmitted by the respective base stations; a reception power selector configured to select a reception power which is a base for measurement of the quality in the area, out of the reception powers measured by the reception power measuring unit; and an area quality measuring unit configured to measure the quality in the area on the basis of the reception power selected by the reception power selector, and a total of the reception powers not selected by the reception power selector.
Public/Granted literature
- US20070243829A1 MEASURING APPARATUS AND AREA QUALITY MEASURING METHOD Public/Granted day:2007-10-18
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