Invention Grant
US08055464B2 Method of processing waveform data from one or more channels using a test and measurement instrument
有权
使用测试和测量仪器处理来自一个或多个通道的波形数据的方法
- Patent Title: Method of processing waveform data from one or more channels using a test and measurement instrument
- Patent Title (中): 使用测试和测量仪器处理来自一个或多个通道的波形数据的方法
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Application No.: US12206072Application Date: 2008-09-08
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Publication No.: US08055464B2Publication Date: 2011-11-08
- Inventor: Keith D. Rule , Mehrab Sedeh , Robert D. Twete , Tristan A. Robinson
- Applicant: Keith D. Rule , Mehrab Sedeh , Robert D. Twete , Tristan A. Robinson
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Langlotz Patent Works, Inc.
- Agent Thomas F. Lenihan; Francis I. Gray
- Main IPC: G01R13/22
- IPC: G01R13/22
Abstract:
The method of processing waveform data from one or more channels using a test and measurement instrument, such as an oscilloscope, is described in which waveform data is collected from a DUT; defining a context is defined by instructing the instrument to obtain the focus of each waveform datum having a first user-defined attribute; defining a selection criteria by instructing the instrument to obtain the focus of each waveform datum having both a first user-defined attribute and a second user-defined attribute; and defining an action by instructing the instrument to perform an operation responsive to finding at least one waveform datum having both the first user-defined attribute and the second user-defined attribute.
Public/Granted literature
- US20100063760A1 METHOD OF PROCESSING WAVEFORM DATA FROM ONE OR MORE CHANNELS USING A TEST AND MEASUREMENT INSTRUMENT Public/Granted day:2010-03-11
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