Invention Grant
US08058634B2 Method and apparatus for determining sheet position using information from two distinct light beams each at a different position and a different angle 失效
用于使用来自两个不同光束的信息来确定片材位置的方法和装置,每个光束在不同的位置和不同的角度

  • Patent Title: Method and apparatus for determining sheet position using information from two distinct light beams each at a different position and a different angle
  • Patent Title (中): 用于使用来自两个不同光束的信息来确定片材位置的方法和装置,每个光束在不同的位置和不同的角度
  • Application No.: US12336098
    Application Date: 2008-12-16
  • Publication No.: US08058634B2
    Publication Date: 2011-11-15
  • Inventor: Xin ChenAnping LiuNaiyue Zhou
  • Applicant: Xin ChenAnping LiuNaiyue Zhou
  • Applicant Address: US NY Corning
  • Assignee: Corning Incorporated
  • Current Assignee: Corning Incorporated
  • Current Assignee Address: US NY Corning
  • Agent Bruce P. Watson
  • Main IPC: G01N21/86
  • IPC: G01N21/86 G06M7/00
Method and apparatus for determining sheet position using information from two distinct light beams each at a different position and a different angle
Abstract:
A method for determining a position of a selected area of a sheet of material relative to a reference plane includes launching a first incident light beam at the selected area of the sheet of material such that the first incident light beam strikes the selected area at a first position and a first angle, thereby producing a first reflected light beam. A second incident light beam is launched at the selected area of the sheet of material such that the second incident light beam strikes the selected area at a second position and a second angle, thereby producing a second reflected light beam. The second position and second angle are different from the first position and first angle, respectively. The first reflected light beam and the second reflected light beam are intercepted at the reference plane. Information related to positions at which the reflected light beams were intercepted and angles at which the incident light beams were launched were received and correlated to the position of the selected area relative to the reference plane.
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