Invention Grant
- Patent Title: Variable resistance nonvolatile memory apparatus
- Patent Title (中): 可变电阻非易失性存储装置
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Application No.: US12302468Application Date: 2008-03-27
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Publication No.: US08058636B2Publication Date: 2011-11-15
- Inventor: Koichi Osano , Satoru Fujii , Shunsaku Muraoka
- Applicant: Koichi Osano , Satoru Fujii , Shunsaku Muraoka
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: McDermott Will & Emery LLP
- Priority: JP2007-086514 20070329
- International Application: PCT/JP2008/000766 WO 20080327
- International Announcement: WO2008/126365 WO 20081023
- Main IPC: H01L29/02
- IPC: H01L29/02 ; H01L47/00

Abstract:
A nonvolatile memory apparatus includes a first electrode (111), a second electrode (112), a variable resistance layer (113) which is disposed between the electrodes, a resistance value of the variable resistance layer reversibly varying between a plurality of resistance states based on an electric signal applied between the electrodes, a first terminal (103) connected to the first electrode, and a second terminal (104) connected to the second terminal. The variable resistance layer comprises at least a tantalum oxide, and is configured to satisfy 0
Public/Granted literature
- US20090250678A1 NONVOLATILE MEMORY APPARATUS, NONVOLATILE MEMORY ELEMENT, AND NONVOLATILE ELEMENT ARRAY Public/Granted day:2009-10-08
Information query
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