Invention Grant
US08058880B2 Calibrated two port passive intermodulation (PIM) distance to fault analyzer
有权
校准两端无源互调(PIM)到故障分析器的距离
- Patent Title: Calibrated two port passive intermodulation (PIM) distance to fault analyzer
- Patent Title (中): 校准两端无源互调(PIM)到故障分析器的距离
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Application No.: US12246330Application Date: 2008-10-06
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Publication No.: US08058880B2Publication Date: 2011-11-15
- Inventor: Donald Anthony Bradley , Alan Charles Witty
- Applicant: Donald Anthony Bradley , Alan Charles Witty
- Applicant Address: US CA Morgan Hill
- Assignee: Anritsu Company
- Current Assignee: Anritsu Company
- Current Assignee Address: US CA Morgan Hill
- Agency: Fliesler Meyer LLP
- Main IPC: G01R31/08
- IPC: G01R31/08

Abstract:
A PIM measurement circuit enables making forward and reverse PIM measurements on any 1 port (reflection) or 2 port (transmission) device with the ability to determine in distance where individual PIM impairments are located as well as their magnitude. The PIM measurement circuit includes two frequency sources that are provided through a combiner for a CW characterization of the PIM circuit. To enable distance determination, an FM measurement is created by using a saw tooth offset sweep generator attached to one of the two frequency sources. With downconversion and processing of signals from the PIM impairments, the FM signal provides a frequency variation that is converted using a Fourier transform or spectrum analysis for separation of frequencies, enabling determination of the distance of the PIM sources as well as their magnitudes.
Public/Granted literature
- US20100085061A1 CALIBRATED TWO PORT PASSIVE INTERMODULATION (PIM) DISTANCE TO FAULT ANALYZER Public/Granted day:2010-04-08
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