Invention Grant
- Patent Title: Test Handler
- Patent Title (中): 测试处理程序
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Application No.: US13033262Application Date: 2011-02-23
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Publication No.: US08058890B2Publication Date: 2011-11-15
- Inventor: Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
- Applicant: Jae-Gyun Shim , Yun-Sung Na , In-Gu Jeon , Tae-Hung Ku
- Applicant Address: KR Hwaseung-si
- Assignee: TechWing Co., Ltd
- Current Assignee: TechWing Co., Ltd
- Current Assignee Address: KR Hwaseung-si
- Agency: Jefferson IP Law, LLP
- Priority: KR10-2005-0075534 20050818
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.
Public/Granted literature
- US20110138934A1 TEST HANDLER Public/Granted day:2011-06-16
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