Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12329635Application Date: 2008-12-08
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Publication No.: US08059547B2Publication Date: 2011-11-15
- Inventor: Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant: Masaru Goishi , Hiroyasu Nakayama , Masaru Tsuto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G06F11/00 ; G08C15/00 ; H04J1/16 ; H04J1/14 ; H04L1/00 ; H04L12/26

Abstract:
Provided is a test apparatus that tests a device under test, comprising an upper sequencer that sequentially designates packets transmitted to and from the device under test, by executing a test program for testing the device under test; a packet data sequence storing section that stores a data sequence included in each of a plurality of types of packets; and a lower sequencer that reads, from the packet data sequence storing section, a data sequence of a packet designated by the upper sequencer and generates a test data sequence used for testing the device under test.
Public/Granted literature
- US20100142383A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2010-06-10
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