Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12557443Application Date: 2009-09-10
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Publication No.: US08060333B2Publication Date: 2011-11-15
- Inventor: Shinichi Ishikawa
- Applicant: Shinichi Ishikawa
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01R31/28

Abstract:
Provided is a test apparatus that tests a device under test, including a pattern list storage section that stores a plurality of pattern lists that each designate, in a prescribed order, the test patterns to be output by the device under test, and a pattern list processing section that (i) sequentially outputs the test patterns by sequentially executing the pattern lists according to test results of the device under test and, (ii) when transitioning from a current pattern list to a subsequent pattern list, repeatedly outputs a prescribed idle pattern until execution of the subsequent pattern list is begun.
Public/Granted literature
- US20110060545A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-03-10
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