Invention Grant
- Patent Title: Systems and methods for measuring at least one thermal property of materials based on a thermal brewster angle
- Patent Title (中): 基于热布鲁斯特角测量材料的至少一种热性质的系统和方法
-
Application No.: US12364848Application Date: 2009-02-03
-
Publication No.: US08065108B2Publication Date: 2011-11-22
- Inventor: Mostafa A. Karam , Charles H. Volk , A. Douglas Meyer
- Applicant: Mostafa A. Karam , Charles H. Volk , A. Douglas Meyer
- Applicant Address: US CA Los Angeles
- Assignee: Northrop Grumman Guidance and Electronics Company, Inc.
- Current Assignee: Northrop Grumman Guidance and Electronics Company, Inc.
- Current Assignee Address: US CA Los Angeles
- Agency: Tarolli, Sundheim, Covell & Tummino LLP
- Main IPC: G01K17/00
- IPC: G01K17/00 ; G01N25/00

Abstract:
One embodiment of the invention includes a system for measuring at least one thermal property of a material. The system includes a thermal source configured to generate an incident thermal wave that propagates through a medium and is provided onto the material at an incident angle. The system also includes a thermal detector that is configured to receive a reflected thermal wave corresponding to the incident thermal wave reflected from the material at a reflection angle that is approximately equal to the incident angle. The system further includes a controller configured to control a magnitude of the incident angle to ascertain a thermal Brewster angle of the material and to calculate the at least one thermal property of the material based on the thermal Brewster angle.
Public/Granted literature
Information query