Invention Grant
US08065117B2 Run-time tunable sample time in programming or modeling environments
有权
在编程或建模环境中运行时可调采样时间
- Patent Title: Run-time tunable sample time in programming or modeling environments
- Patent Title (中): 在编程或建模环境中运行时可调采样时间
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Application No.: US11305907Application Date: 2005-12-19
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Publication No.: US08065117B2Publication Date: 2011-11-22
- Inventor: Biao Yu , Matthew Englehart
- Applicant: Biao Yu , Matthew Englehart
- Applicant Address: US MA Natick
- Assignee: The MathWorks, Inc.
- Current Assignee: The MathWorks, Inc.
- Current Assignee Address: US MA Natick
- Agency: Nelson Mullins Riley & Scarborough LLP
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06F9/45

Abstract:
Programming or modeling environments in which programs or models are simulated or executed with tunable sample times are disclosed. The tunable sample times can be changed during the simulation or execution of the programs or models without recompiling the programs or models. The sample times are parameterized and the value of the sample times is changed during the simulation or execution of the programs or models. The sample times may be changed manually by a user. Alternatively, the sample times may be automatically changed by programmatically defining when and how the sample times are determined.
Public/Granted literature
- US20070143095A1 Run-time tunable sample time in programming or modeling environments Public/Granted day:2007-06-21
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