Invention Grant
- Patent Title: Universal instrument calibration system and method of use
- Patent Title (中): 通用仪器校准系统及使用方法
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Application No.: US11678985Application Date: 2007-02-26
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Publication No.: US08067726B2Publication Date: 2011-11-29
- Inventor: Daniel Eduardo Groszmann , Jonathan Schiff , Ella Zaslavsky
- Applicant: Daniel Eduardo Groszmann , Jonathan Schiff , Ella Zaslavsky
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: McAndrews, Held & Malloy, Ltd.
- Agent William Baxter
- Main IPC: G01D18/00
- IPC: G01D18/00

Abstract:
Certain embodiments of the present invention provide systems and methods for electromagnetic calibration of an instrument. Certain embodiments provide an electromagnetic instrument calibration system including electromagnetic receiver electronics for receiving electromagnetic field information from an electromagnetic transmitter. The system also includes a calibration mount configured to position the electromagnetic receiver electronics stationary with respect to the calibration mount for calibrating an instrument having an electromagnetic transmitter using the calibration mount and the electromagnetic receiver electronics. Certain embodiments provide a method for calibration of an instrument based on electromagnetic field information including providing a calibration mount accommodating a plurality of instruments in a known position and orientation and having electromagnetic calibration electronics positioned with respect to the calibration mount; receiving electromagnetic field information for an instrument with respect to a known position of the calibration mount and electromagnetic calibration electronics; and calibrating at least a portion of the instrument.
Public/Granted literature
- US20080204000A1 UNIVERSAL INSTRUMENT CALIBRATION SYSTEM AND METHOD OF USE Public/Granted day:2008-08-28
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