Invention Grant
- Patent Title: System-level ESD detection circuit
- Patent Title (中): 系统级ESD检测电路
-
Application No.: US12283868Application Date: 2008-04-18
-
Publication No.: US08067952B2Publication Date: 2011-11-29
- Inventor: Ming-Dou Ker , Wen-Yi Chen , Hsin-Chin Jiang
- Applicant: Ming-Dou Ker , Wen-Yi Chen , Hsin-Chin Jiang
- Applicant Address: TW Jhonghe, Taipei County
- Assignee: Amazing Microelectronic Corp.
- Current Assignee: Amazing Microelectronic Corp.
- Current Assignee Address: TW Jhonghe, Taipei County
- Agency: Morris Manning & Martin LLP
- Agent Tim Tingkang Xia, Esq.
- Main IPC: G01R31/02
- IPC: G01R31/02 ; G01R31/26

Abstract:
An ESD detection circuit for detecting a level of an ESD voltage on a power rail is provided. The ESD detection circuit includes a resistive component, a diode unit, and a controller. The resistive component is coupled between a detection node and a ground node corresponding to the power rail. The diode unit is coupled between the power rail and the detection node in a forward direction toward the power rail. The controller, coupled to the detection node, is used for determining the level of the ESD voltage based on the voltage of the detection node and the breakdown voltage of the diode unit.
Public/Granted literature
- US20090287435A1 SYSTEM-LEVEL ESD DETECTION CIRCUIT Public/Granted day:2009-11-19
Information query