Invention Grant
- Patent Title: Microlens alignment procedures in CMOS image sensor design
- Patent Title (中): CMOS图像传感器设计中的微透镜对准程序
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Application No.: US12489147Application Date: 2009-06-22
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Publication No.: US08068284B2Publication Date: 2011-11-29
- Inventor: Chen Feng
- Applicant: Chen Feng
- Applicant Address: US DE Wilmington
- Assignee: Intellectual Ventures II LLC
- Current Assignee: Intellectual Ventures II LLC
- Current Assignee Address: US DE Wilmington
- Agency: McAndrews, Held & Malloy Ltd.
- Main IPC: G02B27/10
- IPC: G02B27/10

Abstract:
A method for aligning a microlens array in a sensor die to resolve non-symmetric brightness distribution and color balance of the image captured by the sensor die. The method includes performing a pre-simulation to simulate a microlens array alignment in a silicon die and to determine a shrink-factor and de-centering values, calculating the error in a real product's alignment in process and image offset, performing a post simulation based on offset calculation on the real product and re-design of the microlens alignment, and repeating the steps of calculating the error and performing the post-simulation until a satisfactory brightness distribution is obtained. The sensor die has sensor pixels, each pixel comprising a photodiode and a microlens for directing incoming light rays to the photodiode, wherein optical axis of the microlens is shifted with respect to optical axis of the photodiode by a preset amount determined by at least one iteration of alignment process.
Public/Granted literature
- US20100146477A1 MICROLENS ALIGNMENT PROCEDURES IN CMOS IMAGE SENSOR DESIGN Public/Granted day:2010-06-10
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