Invention Grant
US08069026B2 Clock gating analyzing apparatus, clock gating analyzing method, and computer product
有权
时钟选通分析装置,时钟选通分析方法和计算机产品
- Patent Title: Clock gating analyzing apparatus, clock gating analyzing method, and computer product
- Patent Title (中): 时钟选通分析装置,时钟选通分析方法和计算机产品
-
Application No.: US12002349Application Date: 2007-12-17
-
Publication No.: US08069026B2Publication Date: 2011-11-29
- Inventor: Hiroyuki Higuchi
- Applicant: Hiroyuki Higuchi
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Greer, Burns & Crain, Ltd.
- Priority: JP2007-032540 20070213
- Main IPC: G06F17/50
- IPC: G06F17/50

Abstract:
Clock gating analysis of a target circuit having a plurality of clock gates, involves the calculation of a clock gate function for each of the clock gates. The clock gate functions indicate an activation state of the clock gates and a combination of output values from sequential circuit elements in the target circuit are substituted into each of the clock gate functions to obtained clock gate function values. Combinations of the clock gate function values form individual clock gating states. Each clock gating state indicates an activation state of each of the local clocks, collectively. A table indicating correlations between the combinations of output values and the clock gating states is generated and from the conversion table, a group that includes all of the clock gating states possible is output.
Public/Granted literature
- US20080195367A1 Clock gating analyzing apparatus, clock gating analyzing method, and computer product Public/Granted day:2008-08-14
Information query