Invention Grant
- Patent Title: Probe testing structure
- Patent Title (中): 探头测试结构
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Application No.: US11820877Application Date: 2007-06-20
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Publication No.: US08069491B2Publication Date: 2011-11-29
- Inventor: Timothy E. Lesher
- Applicant: Timothy E. Lesher
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: DASCENZO Intellectual Property Law, P.C.
- Main IPC: G01Q40/00
- IPC: G01Q40/00
Abstract:
A calibration structure for probing devices.
Public/Granted literature
- US20080218187A1 Probe testing structure Public/Granted day:2008-09-11
Information query
