Invention Grant
- Patent Title: Spin-torque probe microscope
- Patent Title (中): 旋转力矩探头显微镜
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Application No.: US12059407Application Date: 2008-03-31
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Publication No.: US08069492B2Publication Date: 2011-11-29
- Inventor: Haiwen Xi , Song S. Xue
- Applicant: Haiwen Xi , Song S. Xue
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Agency: Mueting, Raasch & Gebhardt PA
- Main IPC: G01Q60/08
- IPC: G01Q60/08

Abstract:
A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to the magnetic tip, an electrical circuit providing a spin-polarized electron current to the electrically conductive sample, and a vibration detection element configured to sense vibration frequency of the cantilever probe body. The spin-polarized electron current is sufficient to alter a local electron spin or magnetic moment within the electrically conductive sample and be sensed by the magnetic tip.
Public/Granted literature
- US20090242764A1 SPIN-TORQUE PROBE MICROSCOPE Public/Granted day:2009-10-01
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