Invention Grant
US08077300B2 MTF measuring system, MTF measuring method, MTF measuring unit and MTF measuring program
有权
MTF测量系统,MTF测量方法,MTF测量单元和MTF测量程序
- Patent Title: MTF measuring system, MTF measuring method, MTF measuring unit and MTF measuring program
- Patent Title (中): MTF测量系统,MTF测量方法,MTF测量单元和MTF测量程序
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Application No.: US12376600Application Date: 2007-08-03
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Publication No.: US08077300B2Publication Date: 2011-12-13
- Inventor: Takashi Masuda , Kouki Yoshida , Takaharu Aoki , Kenichiro Waki
- Applicant: Takashi Masuda , Kouki Yoshida , Takaharu Aoki , Kenichiro Waki
- Applicant Address: JP Tokyo
- Assignee: Acutelogic Corporation
- Current Assignee: Acutelogic Corporation
- Current Assignee Address: JP Tokyo
- Agency: Smith Patent Office
- Priority: JP2006-214437 20060807
- International Application: PCT/JP2007/065670 WO 20070803
- International Announcement: WO2008/018573 WO 20080214
- Main IPC: G01B9/00
- IPC: G01B9/00

Abstract:
A MTF measuring system includes measurement result screen data indicative of an object image and an MTF curve image are generated in accordance with the object image data obtained by photographing the object and the MTF curve image data indicative of the MTF curve generated from MTF data that become an index to evaluate lens performance. The measurement result screen based on the generated measurement result screen data is displayed on a real time basis in the case of evaluation measurement operations of the lens performance. A user can grasp the necessity for a focus adjustment from the MTF curve image on the measurement result screen. If necessary, the user can adjust the focus of the object displayed together with the MTF curve image, and at the same time can evaluate the lens performance from the MTF curve image.
Public/Granted literature
- US20100177303A1 MTF MEASURING SYSTEM, MTF MEASURING METHOD, MTF MEASURING UNIT AND MTF MEASURING PROGRAM Public/Granted day:2010-07-15
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