Invention Grant
US08077414B2 System and method for analyzing magnetic media surfaces for thermal erasures and other characteristics
有权
用于分析磁性介质表面的热擦除和其他特性的系统和方法
- Patent Title: System and method for analyzing magnetic media surfaces for thermal erasures and other characteristics
- Patent Title (中): 用于分析磁性介质表面的热擦除和其他特性的系统和方法
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Application No.: US12242483Application Date: 2008-09-30
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Publication No.: US08077414B2Publication Date: 2011-12-13
- Inventor: Daniel D. Rochat , Ryan Osterhout
- Applicant: Daniel D. Rochat , Ryan Osterhout
- Applicant Address: US MA Hopkinton
- Assignee: EMC Corporation
- Current Assignee: EMC Corporation
- Current Assignee Address: US MA Hopkinton
- Agency: Procopio Cory Hargreaves & Savitch LLP
- Agent Stephen C. Beuerle
- Main IPC: G11B5/02
- IPC: G11B5/02 ; G11B27/36

Abstract:
Analyzing magnetic media surfaces for thermal erasures and other characteristics is described. The system includes a drive channel module configured to measure servo automatic gain control values for a magnetic media surface that represent the amount of gain applied by the drive channel module to a preamble signal recorded on the magnetic media surface. The gain control values are then acquired according to certain measurement parameters. The gain control values are then arranged by proximity to each other and organized to generate images that represent changes in the characteristics of the magnetic media surface. Analysis of the images then detects patterns that represent changes in the characteristics of the media surface and determines measurement parameters that coincide with the change in the characteristic.
Public/Granted literature
- US20100080101A1 SYSTEM AND METHOD FOR ANALYZING MAGNETIC MEDIA SURFACES FOR THERMAL ERASURES AND OTHER CHARACTERISTICS Public/Granted day:2010-04-01
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