Invention Grant
- Patent Title: Methods and systems for detecting a narrow-band interferer
- Patent Title (中): 用于检测窄带干扰源的方法和系统
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Application No.: US12099002Application Date: 2008-04-07
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Publication No.: US08077786B2Publication Date: 2011-12-13
- Inventor: Dumitru Mihai Ionescu , Abu Amanullah , Ghobad Heidari-Bateni
- Applicant: Dumitru Mihai Ionescu , Abu Amanullah , Ghobad Heidari-Bateni
- Applicant Address: JP Hachioji-Shi, Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Hachioji-Shi, Tokyo
- Agency: Sheppard Mullin Richter & Hampton LLP
- Main IPC: H04K1/10
- IPC: H04K1/10 ; H04L27/28

Abstract:
Various embodiments of the systems and methods described herein may be used to compute a minimum variance unbiased estimator by receiving a first OFDM signal at a pilot tone, receiving a second OFDM signal sent in the same frequency band and determining a differential phase metric between the first OFDM signal and the second OFDM signal. In some embodiments, the differential phase metric may be used to diversity combine synchronization statistics. In various embodiments, the differential phase metric may be used to detect a narrow-band interference.
Public/Granted literature
- US20080247480A1 METHODS AND SYSTEMS FOR DETECTING A NARROW-BAND INTERFERER Public/Granted day:2008-10-09
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