Invention Grant
US08077960B2 Methods for altering one or more parameters of a measurement system
有权
用于改变测量系统的一个或多个参数的方法
- Patent Title: Methods for altering one or more parameters of a measurement system
- Patent Title (中): 用于改变测量系统的一个或多个参数的方法
-
Application No.: US12985543Application Date: 2011-01-06
-
Publication No.: US08077960B2Publication Date: 2011-12-13
- Inventor: Edward Calvin , Wayne D. Roth
- Applicant: Edward Calvin , Wayne D. Roth
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Agency: Fulbright & Jaworski LLP
- Main IPC: G06K9/00
- IPC: G06K9/00 ; C12Q1/68

Abstract:
Methods for altering one or more parameters of a measurement system are provided. One method includes analyzing a sample using the system to generate values from classification channels of the system for a population of particles in the sample. The method also includes identifying a region in a classification space in which the values for the populations are located. In addition, the method includes determining an optimized classification region for the population using one or more properties of the region. The optimized classification region contains a predetermined percentage of the values for the population. The optimized classification region is used for classification of particles in additional samples.
Public/Granted literature
- US20110106495A1 Methods for Altering One or More Parameters of a Measurement System Public/Granted day:2011-05-05
Information query