Invention Grant
- Patent Title: Delay variation analysis apparatus and delay variation calculation method
- Patent Title (中): 延迟变异分析装置和延迟变化计算方法
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Application No.: US12453357Application Date: 2009-05-07
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Publication No.: US08078428B2Publication Date: 2011-12-13
- Inventor: Fumi Kambara , Yuji Yoshida , Sugio Satoh
- Applicant: Fumi Kambara , Yuji Yoshida , Sugio Satoh
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2008-198869 20080731
- Main IPC: G06F17/18
- IPC: G06F17/18

Abstract:
A method for analyzing a delay time distribution of an N-stage circuit. The method includes a delay time calculation step of calculating maximum deviation delay time of a signal propagating through the circuit and basic delay time of the circuit, a delay variation calculation step of calculating a delay variation value of the N-stage circuit by using the mean square of differences between the maximum deviation delay time of the circuit and the basic delay time of the circuit taken over the N stages, and a step of generating the delay time distribution of the N-stage circuit as a normal distribution by using the calculated delay variation value.
Public/Granted literature
- US20100030516A1 Delay variation analysis apparatus and delay variation calculation method Public/Granted day:2010-02-04
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