Invention Grant
- Patent Title: Nonvolatile semiconductor memory device and method for manufacturing same
- Patent Title (中): 非易失性半导体存储器件及其制造方法
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Application No.: US12535847Application Date: 2009-08-05
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Publication No.: US08084807B2Publication Date: 2011-12-27
- Inventor: Megumi Ishiduki , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yosuke Komori , Masaru Kito , Yoshiaki Fukuzumi , Hideaki Aochi
- Applicant: Megumi Ishiduki , Ryota Katsumata , Masaru Kidoh , Hiroyasu Tanaka , Yosuke Komori , Masaru Kito , Yoshiaki Fukuzumi , Hideaki Aochi
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2008-210450 20080819
- Main IPC: H01L29/792
- IPC: H01L29/792

Abstract:
A multilayer body is formed by alternately stacking electrode films serving as control gates and dielectric films in a direction orthogonal to an upper surface of a silicon substrate. Trenches extending in the word line direction are formed in the multilayer body and a memory film is formed on an inner surface of the trench. Subsequently, a silicon body is buried inside the trench, and a charge storage film and the silicon body are divided in the word line direction to form silicon pillars. This simplifies the configuration of memory cells in the bit line direction, and hence can shorten the arrangement pitch of the silicon pillars, decreasing the area per memory cell.
Public/Granted literature
- US20100044776A1 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME Public/Granted day:2010-02-25
Information query
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