Invention Grant
- Patent Title: Phase detector system
- Patent Title (中): 相位检测器系统
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Application No.: US12066104Application Date: 2006-08-31
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Publication No.: US08085033B2Publication Date: 2011-12-27
- Inventor: Jacobus Adrianus Van Oevelen , Winand Van Sloten , Thomas Stork , Michael Hinz
- Applicant: Jacobus Adrianus Van Oevelen , Winand Van Sloten , Thomas Stork , Michael Hinz
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP05108291 20050909
- International Application: PCT/IB2006/053030 WO 20060831
- International Announcement: WO2007/029149 WO 20070315
- Main IPC: G01R25/00
- IPC: G01R25/00

Abstract:
A phase detection system (100) comprises an input terminal (101), first and second peak detectors (103, 113), an averaging unit (107), an offset unit (122), and a comparator (126). Input terminal (101) is coupled to the first and to the second peak detectors (103, 113) and provides an input signal to phase detection system (100). Averaging unit (107) is coupled between offset unit (122) and both the first peak detector and the second peak detector (103, 113), and generates an intermediate signal. Offset unit (122) is coupled to input terminal (101) and generates two comparable signals by applying a predetermined offset in signal strength to the input signal or the intermediate signal. The comparator (126) is coupled to the offset unit (122) and generates an output signal by comparing the two comparable signals which is indicative of the phase of the input signal.
Public/Granted literature
- US20090212762A1 PHASE DETECTOR SYSTEM Public/Granted day:2009-08-27
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