Invention Grant
- Patent Title: Probe device having first and second probe pins
- Patent Title (中): 探针装置具有第一和第二探针
-
Application No.: US12557842Application Date: 2009-09-11
-
Publication No.: US08085057B2Publication Date: 2011-12-27
- Inventor: Chun-Chieh Wu
- Applicant: Chun-Chieh Wu
- Agency: Steptoe & Johnson LLP
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R1/067 ; G01R31/00

Abstract:
A probe device includes a probe body having a plurality of first holes extending through a first face thereof and a plurality of second holes aligned with the first holes and extending through an opposite second face thereof, a plurality of spaced-apart first probe pins inserted fittingly and removably into respective first holes and each including a first contact portion extending out of the first face, and a first connecting portion extending into the respective first hole, and a plurality of spaced-apart second probe pins inserted fittingly and removably into respective second holes and each including a second contact portion extending out of the second face, and a second connecting portion extending into the respective second hole and having an insert space. The first connecting portion is inserted fittingly and removably into the insert space, and mates with the second connecting portion.
Public/Granted literature
- US20110062980A1 Probe device having first and second probe pins Public/Granted day:2011-03-17
Information query