Invention Grant
- Patent Title: Charge loss compensation during programming of a memory device
- Patent Title (中): 存储器件编程期间的充电损耗补偿
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Application No.: US12123765Application Date: 2008-05-20
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Publication No.: US08085591B2Publication Date: 2011-12-27
- Inventor: Violante Moschiano , Daniel Elmhurst , Giovanni Santin
- Applicant: Violante Moschiano , Daniel Elmhurst , Giovanni Santin
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert, Jay & Polglaze, P.A.
- Main IPC: G11C16/34
- IPC: G11C16/34 ; G11C16/28 ; G11C16/26 ; G11C16/06

Abstract:
In programming a selected word line of memory cells, a first program verify or read operation is performed, after one page of a selected word line is programmed, in order to determine a first quantity of memory cells that have been programmed to a predetermined reference point in the programmed first page distribution. Prior to programming the second page of the selected word line, a second program verify or read operation is performed to determine a second quantity of cells that are still at the reference point. The difference between the first and second quantities is an indication of the quantity of cells that experienced quick charge loss. The difference is used to determine an adjustment voltage for the second page verification operation after programming of the second page.
Public/Granted literature
- US20090290426A1 CHARGE LOSS COMPENSATION DURING PROGRAMMING OF A MEMORY DEVICE Public/Granted day:2009-11-26
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