Invention Grant
US08085597B2 Nonvolatile semiconductor memory and data writing method for nonvolatile semiconductor memory
有权
非易失性半导体存储器和非易失性半导体存储器的数据写入方法
- Patent Title: Nonvolatile semiconductor memory and data writing method for nonvolatile semiconductor memory
- Patent Title (中): 非易失性半导体存储器和非易失性半导体存储器的数据写入方法
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Application No.: US12503091Application Date: 2009-07-15
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Publication No.: US08085597B2Publication Date: 2011-12-27
- Inventor: Takashi Yuda
- Applicant: Takashi Yuda
- Applicant Address: JP Tokyo
- Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee: Oki Semiconductor Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Volentine & Whitt, PLLC
- Priority: JP2008-188791 20080722
- Main IPC: G11C16/04
- IPC: G11C16/04

Abstract:
A method having the steps of applying the same gate voltage to each of gate terminals of a plurality of memory cells via word lines to designate the memory cells as a write target, and simultaneously applying a write voltage that corresponds to each write data across drain-source terminals of two or more memory cells that are write targets via bit lines to write simultaneously a plurality of data elements having mutually different data values to the memory cells.
Public/Granted literature
- US20100020603A1 NONVOLATILE SEMICONDUCTOR MEMORY AND DATA WRITING METHOD FOR NONVOLATILE SEMICONDUCTOR MEMORY Public/Granted day:2010-01-28
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