Invention Grant
- Patent Title: Systems and methods for sampling frequency offset estimation
- Patent Title (中): 用于采样频偏估计的系统和方法
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Application No.: US12111779Application Date: 2008-04-29
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Publication No.: US08085860B2Publication Date: 2011-12-27
- Inventor: Man Wai Kwan , Man Lung Ng , Michael Su , Tao Li
- Applicant: Man Wai Kwan , Man Lung Ng , Michael Su , Tao Li
- Applicant Address: CN Hong Kong
- Assignee: Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Current Assignee: Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Current Assignee Address: CN Hong Kong
- Agency: Fulbright & Jaworski L.L.P.
- Main IPC: H04K1/10
- IPC: H04K1/10
Abstract:
A method comprises receiving a transmission including at least two Orthogonal Frequency Division Multiplexing (OFDM) symbols, estimating a sampling frequency offset associated with the OFDM symbols at least in part by employing a term representing a density of pilots in the OFDM symbols, and compensating for the sampling frequency offset using the estimated sampling frequency offset.
Public/Granted literature
- US20090268829A1 Systems and Methods for Sampling Frequency Offset Estimation Public/Granted day:2009-10-29
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