Invention Grant
- Patent Title: Apparatus for bone density assessment and monitoring
- Patent Title (中): 用于骨密度评估和监测的装置
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Application No.: US12463325Application Date: 2009-05-08
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Publication No.: US08085898B2Publication Date: 2011-12-27
- Inventor: Neeraj Agrawal , Manoocher Mansouri Aliabadi , Christian Wulff , Kahn-Tze Andrew Lim
- Applicant: Neeraj Agrawal , Manoocher Mansouri Aliabadi , Christian Wulff , Kahn-Tze Andrew Lim
- Applicant Address: US CA Hawthorne
- Assignee: Osteometer Meditech, Inc.
- Current Assignee: Osteometer Meditech, Inc.
- Current Assignee Address: US CA Hawthorne
- Agency: Novel IP
- Main IPC: G01N15/02
- IPC: G01N15/02

Abstract:
The present invention relates to a dual energy X-ray apparatus and method for osteoporosis assessment and monitoring. The present invention takes a bone densitometry reading of a patient's wrist to assess osteoporosis and monitor bone loss condition by repeat measurements along with therapy. The bone densitometry system has an X-ray source, dual energy detectors, an arm-rest to place the patient's arm, a motion system to move the source-detector gantry along the patient's forearm, and a computer with a database to archive the wrist image, calculate the bone mineral density, maintain a history of patient information, and generate patient history reports.
Public/Granted literature
- US20100284515A1 Apparatus for Bone Density Assessment and Monitoring Public/Granted day:2010-11-11
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