Invention Grant
US08087282B2 Test management method for indentation tester and indentation tester
有权
压痕测试仪和压痕测试仪的测试管理方法
- Patent Title: Test management method for indentation tester and indentation tester
- Patent Title (中): 压痕测试仪和压痕测试仪的测试管理方法
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Application No.: US12222267Application Date: 2008-08-06
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Publication No.: US08087282B2Publication Date: 2012-01-03
- Inventor: Takeshi Sawa , Masaru Kawazoe , Kenji Okabe
- Applicant: Takeshi Sawa , Masaru Kawazoe , Kenji Okabe
- Applicant Address: JP Kawasaki
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki
- Agency: Oliff & Berridge, PLC
- Priority: JP2007-210818 20070813
- Main IPC: G01G21/30
- IPC: G01G21/30 ; G01N3/48

Abstract:
Disclosed a test management method for an indentation tester which includes a control section and forms an indentation on a surface of a heated or cooled sample by pressing an indenter to which a load is applied onto the surface of the sample, the test management method including the steps of: measuring a predetermined reference block as the sample under a plurality of temperature environments to obtain a test result; calculating a test error caused by temperature environment based on the test result by the control section; and judging whether or not the test error is within a predetermined range by the control section.
Public/Granted literature
- US20090044609A1 Test management method for indentation tester and indentation tester Public/Granted day:2009-02-19
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