Invention Grant
- Patent Title: Removal of particulates from gas sampling stream
- Patent Title (中): 从气体采样流中去除颗粒物
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Application No.: US12368347Application Date: 2009-02-10
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Publication No.: US08087307B2Publication Date: 2012-01-03
- Inventor: Philippe Jean Gauthier , Neil Colin Widmer
- Applicant: Philippe Jean Gauthier , Neil Colin Widmer
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Cantor Colburn LLP
- Main IPC: G01N1/22
- IPC: G01N1/22
Abstract:
A sample probe includes a sample probe tip filter and a deflector disposed in relation to the sample probe tip filter, where the deflector is operable to deflect particles in a gas stream away from the sample probe tip filter.
Public/Granted literature
- US20100199786A1 REMOVAL OF PARTICULATES FROM GAS SAMPLING STREAM Public/Granted day:2010-08-12
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