Invention Grant
- Patent Title: Process for producing photovoltaic device
- Patent Title (中): 光电器件生产工艺
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Application No.: US12993252Application Date: 2008-10-30
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Publication No.: US08088641B2Publication Date: 2012-01-03
- Inventor: Hiroshi Mashima , Koichi Asakusa , Akemi Takano , Nobuki Yamashita , Yoshiaki Takeuchi
- Applicant: Hiroshi Mashima , Koichi Asakusa , Akemi Takano , Nobuki Yamashita , Yoshiaki Takeuchi
- Applicant Address: JP Tokyo
- Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee: Mitsubishi Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Kanesake Berner & Partners, LLP
- International Application: PCT/JP2008/069803 WO 20081030
- International Announcement: WO2010/050035 WO 20100506
- Main IPC: H01L21/00
- IPC: H01L21/00 ; H01L21/20 ; H01L21/36 ; C23C8/00

Abstract:
A process for producing a photovoltaic device, wherein when providing an n-type amorphous silicon layer on an i-type amorphous silicon layer, a desired crystallization ratio can be achieved without reducing the deposition rate. The production process comprises a p-layer formation step of depositing a p-type amorphous silicon layer, an i-layer formation step of depositing an i-type amorphous silicon layer on the p-type amorphous silicon layer, and an n-layer formation step of depositing an n-type amorphous silicon layer on the i-type amorphous silicon layer, wherein the n-layer formation step comprises a first n-layer formation step of depositing a first n-layer on the i-type amorphous silicon layer, and a second n-layer formation step of depositing a second n-layer on the first n-layer, and the deposition conditions for the first n-layer formation step are conditions that yield a higher crystallization ratio than the deposition conditions for the second n-layer formation step, for deposition onto the same base material substrate.
Public/Granted literature
- US20110092012A1 PROCESS FOR PRODUCING PHOTOVOLTAIC DEVICE Public/Granted day:2011-04-21
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