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Invention Grant
US08089180B2 Integrated circuit device, method of controlling operation of integrated circuit device, and method of fabricating integrated circuit device 有权
集成电路装置，集成电路装置的运行控制方法以及集成电路装置的制造方法

Integrated circuit device, method of controlling operation of integrated circuit device, and method of fabricating integrated circuit device
Abstract:
Disclosed is an integrated circuit device comprising a startup operation circuit (101) for carrying out processing necessary for startup and a post-startup operation circuit (102) for carrying out a main operation after completion of the processing necessary for startup, wherein the post-startup operation circuit (102) has an operation guaranteed temperature whose lower limit is higher than a lower limit of an operation guaranteed temperature of the startup operation circuit (101), and the post-startup operation circuit (102) starts the main operation after a temperature of the integrated circuit device exceeds a threshold temperature which is equal to the lower limit of the operation guaranteed temperature of the post-startup operation circuit (102).
Abstract(Chinese):

公开了一种集成电路装置，其包括用于启动启动所需的启动操作电路（101）和用于在完成启动所需的处理之后进行主操作的后启动操作电路（102），其中， 起动运转电路102具有下限比启动运转电路101的运转保证温度的下限高的运转保证温度，而后启动运转电路102在a 集成电路器件的温度超过与启动后操作电路（102）的工作保证温度的下限相等的阈值温度。

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