Invention Grant
US08089293B2 Test and measurement instrument and method of configuring using a sensed impedance
有权
测试和测量仪器以及使用感测阻抗配置的方法
- Patent Title: Test and measurement instrument and method of configuring using a sensed impedance
- Patent Title (中): 测试和测量仪器以及使用感测阻抗配置的方法
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Application No.: US12426878Application Date: 2009-04-20
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Publication No.: US08089293B2Publication Date: 2012-01-03
- Inventor: Michael S. Hagen
- Applicant: Michael S. Hagen
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Derek Meeker; Thomas F. Lenihan
- Main IPC: G01R31/20
- IPC: G01R31/20
Abstract:
A test and measurement instrument including a port including a plurality of connections; an impedance sense circuit configured to sense an impedance coupled to a connection of the plurality of connections; and a controller configured to setup the test and measurement instrument in response to a sensed impedance from the impedance sense circuit.
Public/Granted literature
- US20100264946A1 TEST AND MEASUREMENT INSTRUMENT AND METHOD OF CONFIGURING USING A SENSED IMPEDANCE Public/Granted day:2010-10-21
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