Invention Grant
- Patent Title: On-chip measurement of signals
- Patent Title (中): 片上信号测量
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Application No.: US12489525Application Date: 2009-06-23
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Publication No.: US08089296B2Publication Date: 2012-01-03
- Inventor: Kanak Behari Agarwal , Jerry D. Hayes
- Applicant: Kanak Behari Agarwal , Jerry D. Hayes
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Garg Law Firm, PLLC
- Agent Rakesh Garg; Libby Z. Toub
- Main IPC: G01R31/02
- IPC: G01R31/02

Abstract:
A method, system, and computer usable program product for in an integrated circuit are provided in the illustrative embodiments. A signal to be measured is identified in the IC. The signal is provided as a first control voltage input to a first VCO in the IC. A first output frequency is generated from the first VCO, the first output frequency having a first frequency value corresponding to the signal. The signal is provided as a second control voltage input to a second VCO in the IC. A second output frequency is generated from the second VCO, the second output frequency having a second frequency value corresponding to the signal. The first and the second output frequency values are exported from the IC. A mean value and a standard deviation of the signal are computed using the output first and second frequency values.
Public/Granted literature
- US20100321050A1 ON-CHIP MEASUREMENT OF SIGNALS Public/Granted day:2010-12-23
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