Invention Grant
- Patent Title: Inspecting system and inspecting method
- Patent Title (中): 检查制度和检查方法
-
Application No.: US12889124Application Date: 2010-09-23
-
Publication No.: US08089636B2Publication Date: 2012-01-03
- Inventor: Atsushi Miyake
- Applicant: Atsushi Miyake
- Applicant Address: JP Osaka
- Assignee: KDE Corporation
- Current Assignee: KDE Corporation
- Current Assignee Address: JP Osaka
- Agency: Alleman Hall McCoy Russell & Tuttle LLP
- Priority: JP2009-218686 20090924
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
An object of the present invention is to apply a phase shift method to a workpiece having a rough surface to accurately detect an abnormal concave-convex irregularity. Therefore, in an inspecting system of the present invention, an image of a stripe pattern reflected on an inspection target surface is detected at a shallow angle, and one or more continuous unit stripes of a unit stripes reflected image is specified among the stripe pattern reflected images existing in a predetermined distance range counted from the edge in a closer side to the workpiece. Then, the phase of the specified unit stripes reflected image is varied to apply a phase shift method and scan the inspection target surface with the unit stripes reflected image to thereby detect the abnormal concave-convex irregularity.
Public/Granted literature
- US20110069320A1 INSPECTING SYSTEM AND INSPECTING METHOD Public/Granted day:2011-03-24
Information query