Invention Grant
- Patent Title: Deterioration detection method of composite magnetic head and magnetic disk inspection apparatus
- Patent Title (中): 复合磁头和磁盘检测装置的恶化检测方法
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Application No.: US12830008Application Date: 2010-07-02
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Publication No.: US08089714B2Publication Date: 2012-01-03
- Inventor: Kenichi Shitara , Takao Ishii
- Applicant: Kenichi Shitara , Takao Ishii
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2009-159614 20090706
- Main IPC: G11B27/36
- IPC: G11B27/36

Abstract:
An object of the present invention is to provide a deterioration detection method of a head and a magnetic disk inspection apparatus in which the number of times of exchanging the head due to deterioration is decreased to improve the throughput of an inspection. In the present invention, a resistance value detecting circuit that is directly coupled to both terminals of an MR head is provided to measure the resistance value of the MR head, and the measured value is compared with the initial value of the exchanged head, so that it is possible to recognize a deterioration state of each head irrespective of a magnetic disk as a measurement target.
Public/Granted literature
- US20110002060A1 DETERIORATION DETECTION METHOD OF COMPOSITE MAGNETIC HEAD AND MAGNETIC DISK INSPECTION APPARATUS Public/Granted day:2011-01-06
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