Invention Grant
US08090011B2 Measuring apparatus, measuring method, recording medium, and test apparatus 有权
测量装置,测量方法,记录介质和测试装置

  • Patent Title: Measuring apparatus, measuring method, recording medium, and test apparatus
  • Patent Title (中): 测量装置,测量方法,记录介质和测试装置
  • Application No.: US11952126
    Application Date: 2007-12-06
  • Publication No.: US08090011B2
    Publication Date: 2012-01-03
  • Inventor: Koji Asami
  • Applicant: Koji Asami
  • Applicant Address: JP Tokyo
  • Assignee: Advantest Corporation
  • Current Assignee: Advantest Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Jianq Chyun IP Office
  • Priority: JP2006-283013 20061017
  • Main IPC: H04B17/00
  • IPC: H04B17/00
Measuring apparatus, measuring method, recording medium, and test apparatus
Abstract:
Provided is a measuring apparatus which measures a quadrature modulator, including a supplying section supplying the quadrature modulator with a reference I signal having a predetermined frequency and a reference Q signal whose phase is shifted by 90 degrees from the reference I signal, an extracting section extracting, from a modulation signal output from the quadrature modulator by applying quadrature modulation to the reference IQ signals, a main signal component as the reference IQ signals modulated, and an image signal component occurring at a position symmetric to the modulated reference IQ signals with respect to the carrier signal, and a measurement value calculating section calculating at least one of a carrier phase error and amplitude error which occur between I signal and Q signal sides of the quadrature modulator, and a skew between IQ signals of the quadrature modulator, based on the main signal component and image signal component.
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