Invention Grant
US08090144B2 System and method for adjusting luminance of a light-emitting device on an image measuring machine
有权
用于调整图像测量机上的发光装置的亮度的系统和方法
- Patent Title: System and method for adjusting luminance of a light-emitting device on an image measuring machine
- Patent Title (中): 用于调整图像测量机上的发光装置的亮度的系统和方法
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Application No.: US12264915Application Date: 2008-11-05
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Publication No.: US08090144B2Publication Date: 2012-01-03
- Inventor: Chih-Kuang Chang , Xian-Yi Chen , Zhong-Kui Yuan
- Applicant: Chih-Kuang Chang , Xian-Yi Chen , Zhong-Kui Yuan
- Applicant Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen, Guangdong Province TW Tu-Cheng, New Taipei
- Agency: Altis Law Group, Inc.
- Priority: CN200710202538 20071114
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
A computer-based method for adjusting luminance of a light-emitting device on image measuring machine is provided. The method includes reading a model definition curve and model coordinates of an object and a charge couple device (CCD). The method further includes locating the object and the CCD to positions on the image measuring machine, and capturing a digital image of the object. Furthermore, the method includes adjusting a resistance of the light-emitting device to ensure an ordinate deviation corresponding to each abscissa value between a new definition curve and the model definition curve falls in an allowable deviation range. A related system is also provided.
Public/Granted literature
- US20090123033A1 SYSTEM AND METHOD FOR ADJUSTING LUMINANCE OF A LIGHT-EMITTING DEVICE ON AN IMAGE MEASURING MACHINE Public/Granted day:2009-05-14
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