Invention Grant
- Patent Title: Self-testing, monitoring and diagnostics in grouped circuitry modules
- Patent Title (中): 分组电路模块中的自检,监测和诊断
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Application No.: US12728598Application Date: 2010-03-22
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Publication No.: US08090551B2Publication Date: 2012-01-03
- Inventor: Kenneth V. Almonte
- Applicant: Kenneth V. Almonte
- Applicant Address: US MI Portland
- Assignee: Electro Scientific Industries, Inc.
- Current Assignee: Electro Scientific Industries, Inc.
- Current Assignee Address: US MI Portland
- Agency: Young Basile
- Main IPC: G06F15/00
- IPC: G06F15/00 ; G01R31/12

Abstract:
An electrical test system for providing a power source to each of a plurality of electrical components under electrical test includes a grouped circuitry module. The grouped circuitry module includes a plurality of individually-programmable power sources, each coupled to an output channel, a controller configured to program each of the power sources to a respective stimulus output value and to read a measured value at each corresponding output channel and random access, non-volatile, memory for storing information and for providing read/write capability for the controller. A host computer is in communication with the controller for running a self test program that sequentially programs each of the power sources to its respective stimulus output value and reads the measured value at each corresponding output channel using the controller to determine if the tested complete subsystem is operating properly.
Public/Granted literature
- US20100171512A1 Self-Testing, Monitoring and Diagnostics in Grouped Circuitry Modules Public/Granted day:2010-07-08
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