Invention Grant
- Patent Title: Non-destructive test apparatus
- Patent Title (中): 无损检测仪器
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Application No.: US12437786Application Date: 2009-05-08
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Publication No.: US08091440B2Publication Date: 2012-01-10
- Inventor: Young-Kuk Kim
- Applicant: Young-Kuk Kim
- Applicant Address: KR Gyeonggi-do
- Assignee: Korea Plant Service & Engineering Co., Ltd.
- Current Assignee: Korea Plant Service & Engineering Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Eckert Seamans Cherin & Mellott, LLC
- Priority: KR10-2008-0101516 20081016
- Main IPC: G01N15/08
- IPC: G01N15/08

Abstract:
The present invention provides a non-destructive test apparatus which can be applied not only to a structure in dry conditions but also to a structure constructed under water or in a location to which it is difficult for a worker to gain access. The non-destructive test apparatus includes a support frame which is disposed adjacent to the target structure and has a vertical guide rail, and a vacuum box which moves upwards or downwards along the guide rail of the support frame. The vacuum box is attached to the target structure and creates a vacuum therein. The non-destructive test apparatus further includes a hoist which is provided on the upper end of the support frame to move the vacuum box upwards or downwards, a fastening unit which fastens the support frame and the vacuum box to the target structure, and a vacuum pump which creates a vacuum in the vacuum box. The non-destructive test apparatus further includes a defect detecting unit which measures a strength of vacuum in the vacuum box to determine whether the target structure is defective, and a control unit which controls the elements.
Public/Granted literature
- US20100095748A1 NON-DESTRUCTIVE TEST APPARATUS Public/Granted day:2010-04-22
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