Invention Grant
US08092023B2 Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
有权
用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法
- Patent Title: Ocular surface interferometry (OSI) methods for imaging and measuring ocular tear film layer thickness(es)
- Patent Title (中): 用于成像和测量眼泪膜层厚度的眼表干涉测量(OSI)方法
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Application No.: US12798326Application Date: 2010-04-01
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Publication No.: US08092023B2Publication Date: 2012-01-10
- Inventor: Donald R. Korb , William L. Weber , Randal B. Chinnock , Benjamin T. Gravely , Stephen M. Grenon , Michael Zelina
- Applicant: Donald R. Korb , William L. Weber , Randal B. Chinnock , Benjamin T. Gravely , Stephen M. Grenon , Michael Zelina
- Applicant Address: US NC Morrisville
- Assignee: TearScience, Inc.
- Current Assignee: TearScience, Inc.
- Current Assignee Address: US NC Morrisville
- Agency: Withrow & Terranova, PLLC
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/10

Abstract:
Ocular surface interferometry (OSI) devices, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film, including lipid layer thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). An imaging device can be focused on the lipid layer of the tear film to capture optical wave interference interactions of specularly reflected light from the tear film combined with a background signal(s) in a first image. The imaging device can also be focused on the lipid layer of the tear film to capture a second image containing the background signal(s) present in the first image. The second image can be subtracted from the first image to reduce and/or eliminate the background signal(s) in the first image to produce a resulting image. The resulting image can be processed and analyzed to measure a TFLT.
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