Invention Grant
- Patent Title: Eye measurement apparatus and methods of using same
- Patent Title (中): 眼睛测量装置及其使用方法
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Application No.: US12264965Application Date: 2008-11-05
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Publication No.: US08092024B2Publication Date: 2012-01-10
- Inventor: Lloyd G. Allred , Jeffrey B. McBeth
- Applicant: Lloyd G. Allred , Jeffrey B. McBeth
- Applicant Address: US NY Rochester
- Assignee: Bausch & Lomb Incorporated
- Current Assignee: Bausch & Lomb Incorporated
- Current Assignee Address: US NY Rochester
- Agent Jeffrey Powers
- Main IPC: A61B3/10
- IPC: A61B3/10 ; A61B3/00

Abstract:
An apparatus for measuring a subject's eye having an instrument axis, comprising a slit projector for projecting slits of light, at least one sensor. The apparatus being adapted to form a first image of light from a first slit on the at least one sensor after the light scatters from the eye along a first pathway. The apparatus adapted to form a second image of light from the first slit on the at least one sensor after the light scatters from the eye along a second pathway. The apparatus comprising a processor operatively coupled to receive the first image and the second image, the processor adapted to perform a projective transformation of the second image and to combine data from the first image and the second image, after it is transformed, to form a third image.
Public/Granted literature
- US20100110380A1 Eye Measurement Apparatus and Methods of Using Same Public/Granted day:2010-05-06
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