Invention Grant
- Patent Title: Semiconductor device manufacturing method and substrate processing apparatus
- Patent Title (中): 半导体装置的制造方法和基板处理装置
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Application No.: US12750105Application Date: 2010-03-30
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Publication No.: US08093158B2Publication Date: 2012-01-10
- Inventor: Taketoshi Sato , Masayuki Tsuneda
- Applicant: Taketoshi Sato , Masayuki Tsuneda
- Applicant Address: JP Tokyo
- Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee: Hitachi Kokusai Electric, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Brundidge & Stanger, P.C.
- Priority: JP2009-210590 20090911
- Main IPC: H01L21/30
- IPC: H01L21/30

Abstract:
Provided are a semiconductor device manufacturing method and a substrate processing apparatus. The method comprise: a first process of forming a film containing a predetermined element on a substrate by supplying a source gas containing the predetermined element to a substrate processing chamber in which the substrate is accommodated; a second process of removing the source gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; a third process of modifying the predetermined element-containing film formed in the first process by supplying a modification gas that reacts with the predetermined element to the substrate processing chamber; a fourth process of removing the modification gas remaining in the substrate processing chamber by supplying an inert gas to the substrate processing chamber; and a filling process of filling an inert gas in a gas tank connected to the substrate processing chamber.
Public/Granted literature
- US20110065283A1 SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND SUBSTRATE PROCESSING APPARATUS Public/Granted day:2011-03-17
Information query
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