Invention Grant
- Patent Title: Underfilled semiconductor die assemblies and methods of forming the same
- Patent Title (中): 欠填充的半导体管芯组件及其形成方法
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Application No.: US11586071Application Date: 2006-10-25
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Publication No.: US08093730B2Publication Date: 2012-01-10
- Inventor: Frank L. Hall , Cary J. Baerlocher
- Applicant: Frank L. Hall , Cary J. Baerlocher
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: TraskBritt
- Main IPC: H01L23/29
- IPC: H01L23/29 ; H01L23/28 ; H01L21/44

Abstract:
An apparatus and method may be used for packaging a semiconductor die and a carrier substrate to substantially prevent trapped moisture therebetween and provide a robust, inflexible cost-effective bond. The semiconductor die is attached to the carrier substrate with a plurality of discrete adhesive elements so as to provide a gap or standoff therebetween. Wire bonds may then be formed between bond pads on the semiconductor die to conductive pads or terminals on the carrier substrate. With this arrangement, a dielectric filler material is disposed in the gap or standoff to form a permanent bonding agent between the semiconductor die and the carrier substrate. By applying the dielectric filler material after forming the wire bonds, the dielectric filler material coats at least a portion of the wire bonds to stabilize the wire bonds and prevent wire sweep in an encapsulation process, such as transfer molding, performed thereafter.
Public/Granted literature
- US20070040264A1 Underfilled semiconductor die assemblies and methods of forming the same Public/Granted day:2007-02-22
Information query
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