Invention Grant
- Patent Title: Glass thickness measurement using fluorescence
- Patent Title (中): 使用荧光的玻璃厚度测量
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Application No.: US12535850Application Date: 2009-08-05
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Publication No.: US08094293B2Publication Date: 2012-01-10
- Inventor: William J. Furnas , Sarath K. Tennakoon , Gary C. Weber
- Applicant: William J. Furnas , Sarath K. Tennakoon , Gary C. Weber
- Applicant Address: CH Cham
- Assignee: Emhart Glass S.A.
- Current Assignee: Emhart Glass S.A.
- Current Assignee Address: CH Cham
- Agency: Reinhart Boerner Van Deuren s.c.
- Main IPC: G01B11/16
- IPC: G01B11/16

Abstract:
An apparatus and method for measurement of the stress in and thickness of flat glass or curved glass segments is disclosed that uses fluorescence to quickly and accurately ascertain both the thickness of the stress layers and the wall thickness in addition to the stress curve in flat glass or curved glass segments. The apparatus and method may be used to quickly and accurately measure both the stress in and the thickness of flat glass or curved glass segments at a plurality of various locations therein. The apparatus and method are adapted for large scale flat glass or curved glass segment manufacturing, and are capable of high speed measurement of the stress in and the thickness of the flat glass or curved glass segments.
Public/Granted literature
- US20110032524A1 Glass Thickness Measurement Using Fluorescence Public/Granted day:2011-02-10
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