Invention Grant
- Patent Title: Laser-based maintenance apparatus for inspecting flaws
- Patent Title (中): 用于检查缺陷的基于激光的维护设备
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Application No.: US12766445Application Date: 2010-04-23
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Publication No.: US08094297B2Publication Date: 2012-01-10
- Inventor: Makoto Ochiai , Takahiro Miura , Hidehiko Kuroda , Fukashi Osakata , Satoshi Yamamoto , Kentaro Tsuchihashi , Masahiro Yoshida , Akira Tsuyuki
- Applicant: Makoto Ochiai , Takahiro Miura , Hidehiko Kuroda , Fukashi Osakata , Satoshi Yamamoto , Kentaro Tsuchihashi , Masahiro Yoshida , Akira Tsuyuki
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2005-199465 20050707; JP2005-199466 20050707; JP2005-199467 20050707; JP2005-199469 20050707; JP2005-199472 20050707; JP2005-228801 20050707; JP2006-052255 20060228
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A surface inspecting method for inspecting a flaw of a test object using a surface wave and estimating a depth of the flaw of the test object from an attenuation ratio of a frequency of a generation wave, the surface inspecting method including calculating a power spectrum of generation wave generating the flaw of the test object; integrating the power spectrum of the generation wave passing the flaw of the test object and calculating an integration value thereof; converting the integration value into a flaw depth based on a calibration created beforehand and calculating the flaw depth of the test object; and displaying the calculated flaw depth of the test object.
Public/Granted literature
- US20100199768A1 LASER-BASED MAINTENANCE APPARATUS Public/Granted day:2010-08-12
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