Invention Grant
- Patent Title: Wavelength modulation spectroscopy method and system
- Patent Title (中): 波长调制光谱法和系统
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Application No.: US12317059Application Date: 2008-12-18
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Publication No.: US08094313B2Publication Date: 2012-01-10
- Inventor: Pawel Kluczynski , Stefan Lundqvist , Per-Arne Thorsén
- Applicant: Pawel Kluczynski , Stefan Lundqvist , Per-Arne Thorsén
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Priority: EP07024934 20071221
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A method and system for measuring the concentration of a gas component in a measuring gas a provided. The wavelength of a light source is modulated with a modulation signal at a modulation frequency, while the wavelength is swept over an interaction feature of a sample. The intensity of the light source is further modulated at a wavelength outside the interaction feature with a burst signal, where an N-th harmonic of the burst frequency coincides with an M-th harmonic of the modulation frequency. The light is passed to the sample and thereafter to a detector. The detector output is demodulated at the M-th harmonic, and the demodulated detector output is normalized by calculating the ratio between a demodulated detector output portion derived from the light modulated with the modulation signal and another demodulated detector output portion derived from the light modulated with the burst signal.
Public/Granted literature
- US20090201507A1 Wavelength modulation spectroscopy method and system Public/Granted day:2009-08-13
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