Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US12647294Application Date: 2009-12-24
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Publication No.: US08094566B2Publication Date: 2012-01-10
- Inventor: Mamoru Hiraide
- Applicant: Mamoru Hiraide
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Chen Yoshimura LLP
- Main IPC: H04L12/26
- IPC: H04L12/26

Abstract:
Provided is a test apparatus that tests a device under test, comprising a test module section that tests the device under test; a test control section that generates control packets for controlling the test module section; and a connecting section that receives the control packets from the test control section and transmits the control packets to the test module section. The test module section includes a first test module that operates according to control packets having a first packet structure and a second test module that operates according to control packets having a second packet structure, which is obtained by adding an expansion region to a control packet having the first packet structure, the test control section transmits control packets having the second packet structure to the connecting section, and the connecting section (i) removes the expansion region from control packets having the second packet structure received from the test control section and transmits the resulting control packets to the first test module, and (ii) transmits control packets having the second packet structure received from the test control section to the second test module.
Public/Granted literature
- US20110158103A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-06-30
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