Invention Grant
- Patent Title: Graphical automated machine control and metrology
- Patent Title (中): 图形自动化机器控制和计量
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Application No.: US12697840Application Date: 2010-02-01
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Publication No.: US08095231B2Publication Date: 2012-01-10
- Inventor: David J. Tasker , Henri J. Lezec , David A. Head
- Applicant: David J. Tasker , Henri J. Lezec , David A. Head
- Applicant Address: US OR Hillsboro
- Assignee: FEI Company
- Current Assignee: FEI Company
- Current Assignee Address: US OR Hillsboro
- Agency: Scheinberg & Griner, LLP
- Agent David Griner; Michael O. Scheinberg
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A graphical programming system allows a user to place geometric shapes onto a scaled image, the shape having associated behavior that operates on the image or on the object of which the image is formed. In a preferred embodiment, the shapes are objects in the Visio program by Microsoft Corporation. The shapes are dragged from a stencil onto an image provided by ion beam or electron microscope image. The shape invokes software or hardware to locate and measure features on the image or to perform operations, such as ion beam milling, on the object that is imaged.
Public/Granted literature
- US20100138028A1 GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY Public/Granted day:2010-06-03
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