Invention Grant
- Patent Title: Error scanning in flash memory
- Patent Title (中): 在闪存中扫描错误
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Application No.: US12846629Application Date: 2010-07-29
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Publication No.: US08095835B2Publication Date: 2012-01-10
- Inventor: William Henry Radke , Peter Sean Feeley , Siamack Nemazie
- Applicant: William Henry Radke , Peter Sean Feeley , Siamack Nemazie
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00
Abstract:
Various embodiments include methods, apparatus, and systems to scan at least a portion of a memory device for potential errors when a condition for scanning is met. The condition may be dependent on one or more of a number of read operations, a number of write operations, time, and others. Other embodiments including additional methods, apparatus, and systems are disclosed.
Public/Granted literature
- US20100313077A1 ERROR SCANNING IN FLASH MEMORY Public/Granted day:2010-12-09
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